One of the key ideas in lean manufacturing is that defects should be detected as early as possible. Efforts to control manufacturing processes so that issues can be detected before defects occur ...

The classical memory-type control charts, Adaptive EWMA (AE) and Truncated Adaptive EWMA (TAE) are chart types whose analytical properties are traditionally derived under normality assumptions, ...

There is a boom in the volume of semiconductor devices being manufactured, and the boom is primarily credited to the proliferation of Internet of Things (IoT)-based devices in our daily lives. IoT ...

A medical device manufacturer ditched a clunky ERP module for quality inspection, opting instead for specialized statistical process control software. Upgrading to new software costs time and money ...