A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...
A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...
Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical ...
A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...
Chiral metasurfaces can strongly twist the polarization of light, but how this process unfolds in space and time has been unclear. Scientists in China have now used ultrafast electron microscopy and ...
Cryo-transmission electron microscopy (cryo-TEM) allows us to observe samples in a preserved state that is close to their native form, making it a highly effective way to examine biological samples.
Identifying and delineating cell structures in microscopy images is crucial for understanding the complex processes of life.
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